-
1
-
-
0032098211
-
Alkyltrichlorosilane-based self-assembled monolayer films for stiction reduction in silicon micromachines
-
Srinivasan U, Houston M R and Howe R T 1998 Alkyltrichlorosilane-based self-assembled monolayer films for stiction reduction in silicon micromachines J. Microelectromech. Syst. 7 252-60
-
(1998)
J. Microelectromech. Syst.
, vol.7
, pp. 252-260
-
-
Srinivasan, U.1
Houston, M.R.2
Howe, R.T.3
-
2
-
-
0034502893
-
Adhesion hysteresis of silane coated microcantilevers
-
de Boer M P, Knapp J A, Michalske T A, Srinivasan U and Maboudian R 2000 Adhesion hysteresis of silane coated microcantilevers Acta Mater. 48 4531-41
-
(2000)
Acta Mater.
, vol.48
, pp. 4531-4541
-
-
De Boer, M.P.1
Knapp, J.A.2
Michalske, T.A.3
Srinivasan, U.4
Maboudian, R.5
-
3
-
-
58149320561
-
Alkylchlorosilane reactions at the silica surface
-
Hair M L and Tripp C P 1995 Alkylchlorosilane reactions at the silica surface Colloids Surf. A 105 95-103
-
(1995)
Colloids Surf. A
, vol.105
, pp. 95-103
-
-
Hair, M.L.1
Tripp, C.P.2
-
5
-
-
0034268805
-
Chemical vapor deposition of fluoroalkylsilane monolayer films for adhesion control in microelectromechanical systems
-
Mayer T M, de Boer M P, Shinn N D, Clews P J and Michalske T A 2000 Chemical vapor deposition of fluoroalkylsilane monolayer films for adhesion control in microelectromechanical systems J. Vac. Sci. Technol. B 18 2433-40
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, pp. 2433-2440
-
-
Mayer, T.M.1
De Boer, M.P.2
Shinn, N.D.3
Clews, P.J.4
Michalske, T.A.5
-
12
-
-
4444250483
-
Thermal-stability of hydroxyl-groups on a well-defined silica surface
-
Sneh O and George S M 1995 Thermal-stability of hydroxyl-groups on a well-defined silica surface J. Phys. Chem. 99 4639-47
-
(1995)
J. Phys. Chem.
, vol.99
, pp. 4639-4647
-
-
Sneh, O.1
George, S.M.2
-
13
-
-
0017927104
-
Cataylitic aluminas-surface models and characterization of surface sites
-
Knozinger H and Ratnasamy P 1978 Cataylitic aluminas-surface models and characterization of surface sites Catal. Rev. Sci. Eng. 17 31-70
-
(1978)
Catal. Rev. Sci. Eng.
, vol.17
, pp. 31-70
-
-
Knozinger, H.1
Ratnasamy, P.2
-
15
-
-
0141567439
-
Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition
-
Elam J W, Routkevitch D, Mardilovich P P and George S M 2003 Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition Chem. Mater. 15 3507-17
-
(2003)
Chem. Mater.
, vol.15
, pp. 3507-3517
-
-
Elam, J.W.1
Routkevitch, D.2
Mardilovich, P.P.3
George, S.M.4
-
16
-
-
0038397338
-
Vapor deposition of amino-functionalized self-assembled monolayers on MEMS
-
Hankins M G, Resnick P J, Clews P J, Mayer T M, Wheeler D R, Tanner D M and Plass R A 2003 Vapor deposition of amino-functionalized self-assembled monolayers on MEMS Proc. SPIE 4980 238-47
-
(2003)
Proc. SPIE
, vol.4980
, pp. 238-247
-
-
Hankins, M.G.1
Resnick, P.J.2
Clews, P.J.3
Mayer, T.M.4
Wheeler, D.R.5
Tanner, D.M.6
Plass, R.A.7
-
17
-
-
0030218562
-
Surface chemistry for atomic layer growth
-
George S M, Ott A W and Klaus J W 1996 Surface chemistry for atomic layer growth J. Phys. Chem. 100 13121-31
-
(1996)
J. Phys. Chem.
, vol.100
, pp. 13121-13131
-
-
George, S.M.1
Ott, A.W.2
Klaus, J.W.3
-
18
-
-
0036685058
-
Viscous flow reactor with quartz crystal microbalance for thin film growth by atomic layer deposition
-
Elam J W, Groner M D and George S M 2002 Viscous flow reactor with quartz crystal microbalance for thin film growth by atomic layer deposition Rev. Sci. Instrum. 73 2981-7
-
(2002)
Rev. Sci. Instrum.
, vol.73
, pp. 2981-2987
-
-
Elam, J.W.1
Groner, M.D.2
George, S.M.3
-
19
-
-
0037439009
-
Atomic layer deposited protective coatings for micro-electromechanical systems
-
Hoivik N D, Elam J W, Linderman R J, Bright V M, George S M and Lee Y C 2003 Atomic layer deposited protective coatings for micro-electromechanical systems Sensors Actuators A 103 100-8
-
(2003)
Sensors Actuators A
, vol.103
, pp. 100-108
-
-
Hoivik, N.D.1
Elam, J.W.2
Linderman, R.J.3
Bright, V.M.4
George, S.M.5
Lee, Y.C.6
-
20
-
-
33645617336
-
-
Gelest, Inc, 11 East Steel Road, Morrisville, PA 19067
-
Gelest, Inc, 11 East Steel Road, Morrisville, PA 19067
-
-
-
-
21
-
-
0035279363
-
Dichlorodimethylsilane as an anti-stiction monolayer for MEMS: A comparison to the octadecyltrichlorosilane self-assembled monolayer
-
Ashurst W R, Yau C, Carraro C, Maboudian R and Dugger M T 2001 Dichlorodimethylsilane as an anti-stiction monolayer for MEMS: a comparison to the octadecyltrichlorosilane self-assembled monolayer J. Microelectromech. Syst. 10 41-9
-
(2001)
J. Microelectromech. Syst.
, vol.10
, pp. 41-49
-
-
Ashurst, W.R.1
Yau, C.2
Carraro, C.3
Maboudian, R.4
Dugger, M.T.5
-
25
-
-
0034299199
-
The impact of solution agglomeration on the deposition of self-assembled monolayers
-
Bunker B C, Carpick R W, Assink R A, Thomas M L, Hankins M G, Voight J A, Sipola D, de Boer M P and Gulley G L 2000 The impact of solution agglomeration on the deposition of self-assembled monolayers Langmuir 16 7742-51
-
(2000)
Langmuir
, vol.16
, pp. 7742-7751
-
-
Bunker, B.C.1
Carpick, R.W.2
Assink, R.A.3
Thomas, M.L.4
Hankins, M.G.5
Voight, J.A.6
Sipola, D.7
De Boer, M.P.8
Gulley, G.L.9
-
27
-
-
4444308053
-
-
Durham, NC: MEMSCAP Inc.
-
Koester D A, Cowen A, Mahadevan R, Stonefeild M and Hardy B 2003 MUMPs Design Rules Revision 10 (Durham, NC: MEMSCAP Inc.)
-
(2003)
MUMPs Design Rules Revision 10
-
-
Koester, D.A.1
Cowen, A.2
Mahadevan, R.3
Stonefeild, M.4
Hardy, B.5
-
28
-
-
0027565299
-
Mechanical stability and adhesion of microstructures under capillary forces - Part II: Experiments
-
Mastrangelo C H and Hsu C H 1993 Mechanical stability and adhesion of microstructures under capillary forces - part II: experiments J. Microelectrornech. Syst. 2 44-55
-
(1993)
J. Microelectrornech. Syst.
, vol.2
, pp. 44-55
-
-
Mastrangelo, C.H.1
Hsu, C.H.2
-
29
-
-
0032614006
-
An accurate method for determining adhesion of cantilever beams
-
de Boer M P and Michalske T A 1999 An accurate method for determining adhesion of cantilever beams J. Appl. Phys. 86 817-27
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 817-827
-
-
De Boer, M.P.1
Michalske, T.A.2
|