Analytical instrumentation based on force measurements: Combinatorial atomic force microscopy

Analytica Chimica Acta

Volumn 496, Issue 1-2, 2003, Pages 267-277

  Green, John Bruce D ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Analytical instrumentation; Combinatorial atomic force microscopy; Inverted AFM design

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIOCHEMISTRY; ELECTROCHEMISTRY;

BIOCHEMICAL ENHANCEMENT;

CHEMICAL ENGINEERING;

ACCURACY; ANALYTICAL EQUIPMENT; ARTICLE; ATOMIC FORCE MICROSCOPY; BIOCHEMISTRY; BIOMOLECULAR ELECTRONICS; CHEMICAL MODIFICATION; COMBINATORIAL CHEMISTRY; ELECTROCHEMISTRY; FORCE; INSTRUMENTATION; LABORATORY TEST; PRIORITY JOURNAL; SINGLE PHOTON EMISSION COMPUTER TOMOGRAPHY;

EID: 0242330152     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2003.07.004     Document Type: Article

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