Role of surface perfection in chemical force microscopy

Langmuir

Volumn 14, Issue 10, 1998, Pages 2846-2849

  McKendry, Rachel ^a   Theoclitou, Maria Elena ^a   Abell, Chris ^a   Rayment, Trevor ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; COATED MATERIALS; CRYSTAL ORIENTATION; FORCE MEASUREMENT; METALLIC FILMS; MICA; MICROSCOPIC EXAMINATION; MONOLAYERS; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; SURFACE PROPERTIES; SURFACE TREATMENT;

CHEMICAL FORCE MICROSCOPY; SELF ASSEMBLED MONOLAYERS;

GOLD;

EID: 0032072896     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970374e     Document Type: Article

References (36)