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Volumn 74, Issue 13, 2002, Pages 3096-3104
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Contact mechanics modeling of pull-off measurements: Effect of solvent, probe radius, and chemical binding probability on the detection of single-bond rupture forces by atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT MECHANICS MODELING;
ATOMIC FORCE MICROSCOPY;
CHEMICAL MODIFICATION;
FORCE MEASUREMENT;
PROBABILITY;
SELF ASSEMBLY;
SUBSTRATES;
SURFACES;
CHEMICAL BONDS;
SOLVENT;
ADHESION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL BINDING;
HISTOGRAM;
MATHEMATICAL ANALYSIS;
MOLECULAR MODEL;
PERIODICITY;
PROBABILITY;
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EID: 0036645736
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac020075g Document Type: Article |
Times cited : (17)
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References (48)
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