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Volumn 69, Issue 22, 1996, Pages 3306-3308

Near field optics: Snapshot of the field emitted by a nanosource using a photosensitive polymer

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHT SCATTERING; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; PHOTOSENSITIVITY; POLYMETHYL METHACRYLATES; SWELLING;

EID: 0030285450     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117288     Document Type: Article
Times cited : (79)

References (14)
  • 1
    • 0039488344 scopus 로고
    • Near Field Optics, edited by D. W. Pohl and D. Courjon Kluwer Dordrecht, The Netherlands
    • F. Baida, D. Courjon, and G. Tribillon, in Near Field Optics, Vol. 242 of NATO ASI Series, edited by D. W. Pohl and D. Courjon (Kluwer Dordrecht, The Netherlands, 1993), pp. 71-78.
    • (1993) NATO ASI Series , vol.242 , pp. 71-78
    • Baida, F.1    Courjon, D.2    Tribillon, G.3
  • 14
    • 7044284376 scopus 로고    scopus 로고
    • Optical Inspection and Micromeasurement (EUROPTO Conf., Besançon, France, 1996)
    • S. Davy, M. Spajer, and G. Rachard, in Optical Inspection and Micromeasurement (EUROPTO Conf., Besançon, France, 1996) [SPIE Proc. 2782 (1996)].
    • (1996) SPIE Proc. , vol.2782
    • Davy, S.1    Spajer, M.2    Rachard, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.