Near field optics: Snapshot of the field emitted by a nanosource using a photosensitive polymer

Applied Physics Letters

Volumn 69, Issue 22, 1996, Pages 3306-3308

  Davy, Stéphane ^a   Spajer, Michel ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHT SCATTERING; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; PHOTOSENSITIVITY; POLYMETHYL METHACRYLATES; SWELLING;

METALLIZED PROBE; NEAR FIELD OPTICS; PHOTOSENSITIVE POLYMER; TOPOGRAPHY;

PHOTOLITHOGRAPHY;

EID: 0030285450     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117288     Document Type: Article

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