Apertureless scanning near-field optical microscopy: The need for probe-vibration modeling

Optics Letters

Volumn 28, Issue 22, 2003, Pages 2147-2149

  Fikri, Radouane ^a   Grosges, Thomas ^a   Barchiesi, Dominique ^a  

^a CNRS FRE 2671   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DIFFRACTIVE OPTICS; FINITE ELEMENT METHOD; GEOMETRICAL OPTICS; LASER MODE LOCKING; LIGHT POLARIZATION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; MAXWELL EQUATIONS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; VIBRATIONS (MECHANICAL);

DEPOLARIZATION;

ELECTROMAGNETIC WAVE PROPAGATION;

EID: 0242493685     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.28.002147     Document Type: Article

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