Bipolar SCR ESD devices

Microelectronics Reliability

Volumn 45, Issue 3-4, 2005, Pages 457-471

  Vashchenko, V A ^a   Hopper, P ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CARRIER MOBILITY; CHARGE TRANSFER; CMOS INTEGRATED CIRCUITS; ELECTRIC CONDUCTIVITY; ELECTRIC RECTIFIERS; SEMICONDUCTING SILICON; THERMAL EFFECTS;

BIPOLAR SILICON CONTROLLED RECTIFIER (BSCR); ELECTRON INJECTION; ELECTROSTATIC DISCHARGES; EMITTERS; HOLE CURRENT;

ELECTRIC DISCHARGES;

EID: 15744397564     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.12.013     Document Type: Article

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