ESD protection techniques for high frequency integrated circuits

Microelectronics Reliability

Volumn 38, Issue 11, 1998, Pages 1681-1689

  Croft, G ^a   Bernier, J ^a  

^a INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC SHIELDING; ELECTROSTATICS; SEMICONDUCTING SILICON COMPOUNDS;

ELECTROSTATIC DISCHARGE;

INTEGRATED CIRCUITS;

EID: 0032204363     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00171-1     Document Type: Article

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