메뉴 건너뛰기




Volumn , Issue , 2004, Pages 277-280

ESD protection of the high voltage tolerant pins in low-voltage BiCMOS processes

Author keywords

[No Author keywords available]

Indexed keywords

ESD PROTECTION; HIGH VOLTAGE; THIN FILM RESISTORS; TRANSMISSION LINE PULSE (TLP);

EID: 17044368807     PISSN: 10889299     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (10)
  • 1
    • 0033279805 scopus 로고    scopus 로고
    • Wide range control of the sustaining voltage of ESD protection elements realized in a smart power technology
    • H. Gossner, T. Muller-Lynch, K. Esmark, M. Stecher, " Wide range control of the sustaining voltage of ESD protection elements realized in a smart power technology," Proceed of ESD/EOS Symposium, 1999, pp. 19-27.
    • (1999) Proceed of ESD/EOS Symposium , pp. 19-27
    • Gossner, H.1    Muller-Lynch, T.2    Esmark, K.3    Stecher, M.4
  • 2
    • 84860098026 scopus 로고    scopus 로고
    • "Method of forming Zener diode in a NPN and PNP Bipolar process flow that requires no additional steps to set the breakdown voltage, US Patent 6,386,317, Jul/1
    • V.A. Vashchenko, A. Srtrachan, P. Hopper "Method of forming Zener diode in a NPN and PNP Bipolar process flow that requires no additional steps to set the breakdown voltage, US Patent 6,386,317, Jul/1, 2003.
    • (2003)
    • Vashchenko, V.A.1    Srtrachan, A.2    Hopper, P.3
  • 3
    • 0032256942 scopus 로고    scopus 로고
    • A new generation of high voltage MOSFETs breaks the limit line of silicon
    • G. Deboy et.al, "A new generation of high voltage MOSFETs breaks the limit line of silicon", IEDM, pp.683-685, 1998.
    • (1998) IEDM , pp. 683-685
    • Deboy, G.1
  • 4
    • 0034449069 scopus 로고    scopus 로고
    • Mdmesh: Innovative technology for high voltage power MOSFET's
    • M.Saggio, D.Fagone, S. Masumeci, "Mdmesh: innovative technology for high voltage power MOSFET's," Proc. ISPSD 200, pp.65-68, 2000.
    • (2000) Proc. ISPSD , vol.200 , pp. 65-68
    • Saggio, M.1    Fagone, D.2    Masumeci, S.3
  • 7
    • 0033280508 scopus 로고    scopus 로고
    • A compact square-cell ESD Structure for BiCMOS IC
    • A. Z. Wang and C. H. Tsay, "A compact Square-Cell ESD Structure for BiCMOS IC", BCTM 3.1, 1999, p.46
    • (1999) BCTM 3.1 , pp. 46
    • Wang, A.Z.1    Tsay, C.H.2
  • 10
    • 15744381102 scopus 로고    scopus 로고
    • ESD protection of double-diffusion devices in submicron CMOS processes
    • to be printed in
    • A. Concannon, V. A. Vashchenko, M. ter Beek, and P. Hopper, "ESD Protection of Double-Diffusion Devices in Submicron CMOS Processes", to be printed in Proceed. of ESSDERC, 2004.
    • (2004) Proceed. of ESSDERC
    • Concannon, A.1    Vashchenko, V.A.2    Ter Beek, M.3    Hopper, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.