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Volumn 476, Issue 2, 2005, Pages 366-372

The ac conductivity and dielectric properties of Europium-Indium oxide films prepared on silicon (100) substrate

Author keywords

Dielectric phenomena; Europium indium oxide; Insulating films; X ray fluorescence

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; EUROPIUM COMPOUNDS; FLUORESCENCE; INDIUM; MOS DEVICES; SILICON; SUBSTRATES; X RAY ANALYSIS; X RAY DIFFRACTION;

EID: 13844254345     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.10.007     Document Type: Article
Times cited : (8)

References (50)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.