-
1
-
-
0032025112
-
Stylus contact method for surface metrology in the ascendancy
-
Whitehouse D J 1998 Stylus contact method for surface metrology in the ascendancy Meai. Control 31 48-50 (Pubitemid 128613008)
-
(1998)
Measurement and Control
, vol.31
, Issue.2
, pp. 48-50
-
-
Whitehouse, D.J.1
-
4
-
-
85034787854
-
Polarizing optical system
-
UK Patent Application GB 2070276 A
-
Garratt J D, Bates W J and Player M J 1981 Polarizing optical system UK Patent Application GB 2070276 A
-
(1981)
-
-
Garratt, J.D.1
Bates, W.J.2
Player, M.J.3
-
5
-
-
0020154436
-
A new stylus instrument with a wide dynamic range for use in surface metrology
-
Garratt J D 1982 A new stylus instrument with a wide dynamic range for use in surface metrology Precision Engng 4 384-9
-
(1982)
Precision Engng
, vol.4
, pp. 384-389
-
-
Garratt, J.D.1
-
6
-
-
0016128770
-
Digital wavefront measuring interferometer for testing optical surface and lenses
-
Bruning J H, Herriott D R, Gallagher J E, Rosenfeld D P, Whit A D and Brangaccio D J 1974 Digital wavefront measuring interferometer for testing optical surface and lenses Appl. Opt. 13 1235-41
-
(1974)
Appl. Opt.
, vol.13
, pp. 1235-1241
-
-
Bruning, J.H.1
Herriott, D.R.2
Gallagher, J.E.3
Rosenfeld, D.P.4
Whit, A.D.5
Brangaccio, D.J.6
-
7
-
-
0021815465
-
Measurement of surface topography of magnetic tapes by Mirau interferometry
-
Bhushan B, Wyant J C and Kopiopoulos C L 1985 Measurement of surface topography of magnetic tapes by Mirau interferometry Appl. Opt. 24 931-6
-
(1985)
Appl. Opt.
, vol.24
, pp. 931-936
-
-
Bhushan, B.1
Wyant, J.C.2
Kopiopoulos, C.L.3
-
8
-
-
84855243958
-
Phase shifting interferometry with a coupled interferometer: Application to optical roughness of blocks gauges
-
Ishikawa S 1992 Phase shifting interferometry with a coupled interferometer: application to optical roughness of blocks gauges Optics 91 231-5
-
(1992)
Optics
, vol.91
, pp. 231-235
-
-
Ishikawa, S.1
-
9
-
-
85042568763
-
Quantitative surface topography determination by Normarski reflection microscopy
-
Lessor D L, Hartman J S and Gordon R L 1979 Quantitative surface topography determination by Normarski reflection microscopy J. Opt. Soc. Am. 69 189-93
-
(1979)
J. Opt. Soc. Am.
, vol.69
, pp. 189-193
-
-
Lessor, D.L.1
Hartman, J.S.2
Gordon, R.L.3
-
10
-
-
0019057044
-
Quantitative surface topography determination by Nomarski reflection microscopy, microscope modification calibration, and planar sample experiments
-
Hartman J S, Gordon R L and Lessor D L 1980 Quantitative surface topography determination by Nomarski reflection microscopy, microscope modification calibration, and planar sample experiments Appl. Opt. 19 1892-7
-
(1980)
Appl. Opt.
, vol.19
, pp. 1892-1897
-
-
Hartman, J.S.1
Gordon, R.L.2
Lessor, D.L.3
-
11
-
-
0013666630
-
Surface roughness measurement over long scan lengths
-
Bristow T C 1988 Surface roughness measurement over long scan lengths Surf. Topogr. 1 18-23
-
(1988)
Surf. Topogr.
, vol.1
, pp. 18-23
-
-
Bristow, T.C.1
-
12
-
-
0019531992
-
Optical heterodyne profilometry
-
Sommargren G E 1981 Optical heterodyne profilometry Appl. Opt. 20 2675-81
-
(1981)
Appl. Opt.
, vol.20
, pp. 2675-2681
-
-
Sommargren, G.E.1
-
13
-
-
0038844626
-
Step response and spatial resolution of an optical heterodyne profiling instrument
-
Pantzer D 1987 Step response and spatial resolution of an optical heterodyne profiling instrument Appl. Opt. 26 3014-19
-
(1987)
Appl. Opt.
, vol.26
, pp. 3014-3019
-
-
Pantzer, D.1
-
14
-
-
84975534519
-
Heterodyne profiling instrument for angstrom region
-
Pantzer D, Politch J and Er L 1986 Heterodyne profiling instrument for angstrom region Appl. Opt. 25 4168-72
-
(1986)
Appl. Opt.
, vol.25
, pp. 4168-4172
-
-
Pantzer, D.1
Politch, J.2
Er, L.3
-
15
-
-
0026998122
-
Surface detect analysis of semiconductor materials and devices using nanoscopy techniques
-
Montaner D 1992 Surface detect analysis of semiconductor materials and devices using nanoscopy techniques Proc. SPIE 1776 34-45
-
(1992)
Proc. SPIE
, vol.1776
, pp. 34-45
-
-
Montaner, D.1
-
16
-
-
0025558304
-
Angstrom level profilometry for sub-millimetre to meter scale surface errors
-
Glenn P 1990 Angstrom level profilometry for sub-millimetre to meter scale surface errors Proc. SPIE 1333 326-36
-
(1990)
Proc. SPIE
, vol.1333
, pp. 326-336
-
-
Glenn, P.1
-
17
-
-
85034782999
-
Development of high precision stylus diffraction grating interferometric probe and system: Part 1-mechanism and diffraction grating design
-
submitted
-
Fan K C, Su C D and Mou J 2001 Development of high precision stylus diffraction grating interferometric probe and system: part 1-mechanism and diffraction grating design Precision Engng submitted
-
(2001)
Precision Engng
-
-
Fan, K.C.1
Su, C.D.2
Mou, J.3
-
18
-
-
85034760269
-
Development of high precision stylus diffraction grating interferometric probe and system: Part 2-signal processing and applications
-
submitted
-
Fan K C, Su C D and Mou J 2001 Development of high precision stylus diffraction grating interferometric probe and system: part 2-signal processing and applications Precision Engng submitted
-
(2001)
Precision Engng
-
-
Fan, K.C.1
Su, C.D.2
Mou, J.3
-
19
-
-
0142102885
-
New stylus probe with interferometric transducer for surface roughness and form profiling
-
Dobosz M 1994 New stylus probe with interferometric transducer for surface roughness and form profiling Opt. Engng 33 902-7
-
(1994)
Opt. Engng
, vol.33
, pp. 902-907
-
-
Dobosz, M.1
-
20
-
-
0142039338
-
Application of a divergent laser beam in a grating interferometer for high-resolution displacement measurement
-
Dobosz M 1994 Application of a divergent laser beam in a grating interferometer for high-resolution displacement measurement Opt. Engng 33 897-901
-
(1994)
Opt. Engng
, vol.33
, pp. 897-901
-
-
Dobosz, M.1
-
21
-
-
0041907877
-
High-resolution laser transducer of linear displacements
-
Dobosz M 1992 High-resolution laser transducer of linear displacements Opt. Engng 31 500-4
-
(1992)
Opt. Engng
, vol.31
, pp. 500-504
-
-
Dobosz, M.1
-
22
-
-
0345530490
-
The research and design into an intelligence instrument with holographic diffraction grating
-
Tiebang X 1989 The research and design into an intelligence instrument with holographic diffraction grating Proc. 2nd IMECOO TC14 Int. Symp. ISMQC/IMECO pp 296-310
-
(1989)
Proc. 2nd IMECOO TC14 Int. Symp. ISMQC/IMECO
, pp. 296-310
-
-
Tiebang, X.1
-
23
-
-
79952655465
-
Grating technology for topography measurement of curve surface
-
Jiang Z Q, Xie T B, Yao C X and Li Zhu 1993 Grating technology for topography measurement of curve surface Proc. SPIE 2101 554-7
-
(1993)
Proc. SPIE
, vol.2101
, pp. 554-557
-
-
Jiang, Z.Q.1
Xie, T.B.2
Yao, C.X.3
Li, Z.4
-
24
-
-
0020920235
-
Optical profilometer: A practical approximate method of analysis
-
Dobosz M 1983 Optical profilometer: a practical approximate method of analysis Appl. Opt. 22 1892-7
-
(1983)
Appl. Opt.
, vol.22
, pp. 1892-1897
-
-
Dobosz, M.1
-
25
-
-
0021758163
-
Accuracy of profile measurements by means of a focused laser beam
-
Dobosz M 1984 Accuracy of profile measurements by means of focused laser beam Wear 98 117-26 (Pubitemid 15456320)
-
(1984)
Wear
, vol.98
, Issue.1-3
, pp. 117-126
-
-
Dobosz, M.1
-
26
-
-
0012858388
-
Analysis and removal of the systematic phase error in interferograms
-
Yu Q, Andresen K and Osten W 1994 Analysis and removal of the systematic phase error in interferograms Opt. Engng 33 1630-7
-
(1994)
Opt. Engng
, vol.33
, pp. 1630-1637
-
-
Yu, Q.1
Andresen, K.2
Osten, W.3
-
27
-
-
0028493861
-
High-resolution encoding process for an integrated optical analog-to-digital converter
-
Pace P E and Styer D 1994 High-resolution encoding process for an integrated optical analog-to-digital converter Opt. Engng 33 2638-45
-
(1994)
Opt. Engng
, vol.33
, pp. 2638-2645
-
-
Pace, P.E.1
Styer, D.2
-
28
-
-
0018456954
-
An optical analog-to-digital converter design and analysis
-
Taylor H F 1975 An optical analog-to-digital converter design and analysis IEEE J. Quantum Electron. 15 210-16
-
(1975)
IEEE J. Quantum Electron.
, vol.15
, pp. 210-216
-
-
Taylor, H.F.1
|