Test scheduling with power-time tradeoff and hot-spot avoidance using MILP

IEE Proceedings: Computers and Digital Techniques

Volumn 151, Issue 5, 2004, Pages 341-355

  Nourani, M ^a   Chin, J ^a  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; INTEGER PROGRAMMING; INTEGRATED CIRCUIT TESTING; LINEAR PROGRAMMING; MICROPROCESSOR CHIPS; SCHEDULING;

CORE BASED SYSTEMS; MIXED INTEGER LINEAR PROGRAMMIMG; SYSTEMS ON A CHIP (SOC);

COMPUTER CIRCUITS;

EID: 10044225818     PISSN: 13502387     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cdt:20040818     Document Type: Article

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