Testing embedded cores using partial isolation rings

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 10-16

  Touba, Nur A ^a   Pouya, Bahram ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER AIDED LOGIC DESIGN; INTELLECTUAL PROPERTY; VECTORS;

EMBEDDED CORES; PARTIAL ISOLATION RING;

INTEGRATED CIRCUIT TESTING;

EID: 0030685592     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)