Unified compact scalable ΔId model for hot carrier reliability simulation

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1999, Pages 243-248

  Chen, Ping ^a   Wu, Lifeng ^a   Zhang, Gang ^a   Liu, Zhihong ^a  

^a BTA Technology Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON TRAPS; HOT CARRIERS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MOSFET DEVICES; RELIABILITY;

GATE BIAS DEPENDENCY MODELING; HOT CARRIER INDUCED CIRCUIT; INTERFACE STATE GENERATION; OPERATION MODES;

INTEGRATED CIRCUIT TESTING;

EID: 0032670477     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)