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Volumn 215, Issue 3-4, 2004, Pages 457-470

I - V and deep level transient spectroscopy studies on 60 MeV oxygen ion irradiated NPN transistors

Author keywords

Electron irradiation; Ion irradiation; MOSFET; Trapped charge; Voltage shift

Indexed keywords

ACTIVATION ENERGY; ANNEALING; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; DEGRADATION; DOPING (ADDITIVES); ELECTRON IRRADIATION; GAMMA RAYS; OXYGEN; RADIATION EFFECTS; SILICA;

EID: 0942289564     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2003.09.015     Document Type: Article
Times cited : (33)

References (58)
  • 21
    • 0942290839 scopus 로고    scopus 로고
    • Van Nostrand Reinhold, New York, 1986
    • G.C. Messenger, M.S. Ash, Van Nostrand Reinhold, New York, 1986.
    • Messenger, G.C.1    Ash, M.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.