Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1666-1673

  Barnaby, H J ^a   Schrimpf, R D ^a   Pease, R L ^a   Cole, P ^a   Turflinger, T ^a   Krieg, J ^b   Titus, J ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b RLP Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR JUNCTION TRANSISTORS; BIPOLAR LINEAR VOLTAGE COMPARATOR; PARAMETRIC CIRCUIT RESPONSE;

BIPOLAR TRANSISTORS; COMPARATOR CIRCUITS; COMPUTER SIMULATION; DOSIMETRY; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; INTEGRATED CIRCUIT MANUFACTURE; IONIZING RADIATION; SILICA; SUBSTRATES;

BIPOLAR INTEGRATED CIRCUITS;

EID: 0033351820     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819136     Document Type: Article

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