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Volumn 127-128, Issue , 1997, Pages 410-413
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Improved lifetime characteristics in heavy ion irradiated silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
CRYSTAL DEFECTS;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
ENERGY GAP;
ION BOMBARDMENT;
ION IMPLANTATION;
SEMICONDUCTOR DOPING;
THERMAL EFFECTS;
COLLISION CASCADES;
DIVACANCY CENTERS;
HEAVY ION IRRADIATION;
VACANCY OXYGEN COMPLEX;
SEMICONDUCTING SILICON;
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EID: 0031547801
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(96)00966-4 Document Type: Article |
Times cited : (11)
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References (24)
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