Comparison of Adaptive Body Bias (ABB) and Adaptive Supply Voltage (ASV) for Improving Delay and Leakage Under the Presence of Process Variation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 11, Issue 5, 2003, Pages 888-899

  Chen, Tom ^a   Naffziger, Samuel ^b  

^a Engineering Research Center and Hydraulics Laboratory   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

Adjustable back bias (ABB); Adjustable supply voltage (ASV); Process variation; Product binning; Yield

Indexed keywords

DELAY CIRCUITS; ELECTRIC POTENTIAL; ELECTRIC POWER UTILIZATION; LEAKAGE CURRENTS; RELIABILITY;

ADAPTIVE BODY BIAS (ABB);

VLSI CIRCUITS;

EID: 0142196052     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2003.817120     Document Type: Article

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