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Volumn , Issue , 2000, Pages 113-116
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Wire planning for performance and yield enhancement
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
INTEGRATED CIRCUIT MANUFACTURE;
PLANNING;
PRODUCTIVITY;
WIRE;
DEEP SUBMICRON TECHNOLOGY;
WIRE PLANNING STRATEGY;
YIELD ENHANCEMENT;
INTEGRATED CIRCUIT LAYOUT;
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EID: 0033711824
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (15)
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