Development of robust interconnect model based on design of experiments and multiobjective optimization

IEEE Transactions on Electron Devices

Volumn 48, Issue 9, 2001, Pages 1885-1891

  Zhang, Qiang ^b   Liou, Juin J ^a,b   McMacken, J ^c   Thomson, J ^c   Layman, P ^c  

^a IEEE

^b University of Central Florida   (United States)

^c AGERE SYSTEMS   (United States)

Author keywords

Crosstalk; Delay; Design of experiments; Interconnect; Multiobjective optimization; Robust TCAD design

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; MONTE CARLO METHODS; OPTIMIZATION; PERFORMANCE; VLSI CIRCUITS;

DESIGN OF EXPERIMENTS; MULTIOBJECTIVE OPTIMIZATION; PROCESS VARIATIONS; RESPONSE SURFACE MODELS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0035444711     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.944173     Document Type: Article

References (15)

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