Worst/best device and circuit performances for MOSFETs determined from process fluctuations

IEICE Transactions on Electronics

Volumn E82-C, Issue 6, 1999, Pages 997-1002

  Prigge, O ^a   Suetake, M ^b   Miura Mattausch, M ^b  

^a SIEMENS AG   (Germany)

^b HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY VALUE PROBLEMS; COMPUTER SIMULATION; ELECTRIC NETWORK PARAMETERS; FUNCTIONS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PERFORMANCE;

GAUSSIAN FUNCTIONS; PERFORMANCE DISTRIBUTION; PROCESS FLUCTUATIONS;

MOSFET DEVICES;

EID: 0033354320     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)