Molecular imaging and local density of states characterization at the si(111)/naoh interface

Physical Review Letters

Volumn 77, Issue 10, 1996, Pages 1986-1989

  Allongue, P ^a  

^a PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000789386     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.1986     Document Type: Article

References (24)

1. G. S. Higashi and Y. J. Chabal, in Handbook of Semiconductor Wafer Cleaning Technology, W. Kern (Noyes Publications, Park Ridge, NJ, 1993).
2. A. Venkateswara Rao, F. Ozanam, and J.-N. Chazalviel, J. Electrochem. Soc. 138, 153 (1991). JESOAN
3. J. Rappich, H. J. Lewerenz, and H. Gerischer, J. Electrochem. Soc. 141, L187 (1994). JESOAN
4. Sueh Lin, et al., Appl. Phys. Lett. 66, 766 (1995).-Lin APPLAB
5. J. F. Roche, M. Ramonda, F. Thibaudeau, Ph. Dumas, Ph. Mathiez, F. Salvan, and P. Allongue, Microscopy, Microstruct. and Microanal. 5, 291–299 (1994).
6. G. J. Pietsch, U. Köhler, and M. Henzler, J. Appl. Phys. 73, 4797 (1993). JAPIAU
7. P. Jakob and Y. J. Chabal, J. Chem. Phys. 95, 2897 (1991). JCPSA6
8. P. Allongue, V. Kieling, and H. Gerischer, J. Phys. Chem. 99, 9472 (1995). JPCHAX
9. H. E. Hessel, A. Feltz, U. Memmert, and R. J. Behm, Chem. Phys. Lett. 186, 275 (1991). CHPLBC
10. P. Jakob, Y. J. Chabal, K. Raghavachari, R. S. Becker, and A. J. Becker, Surf. Sci. 275, 407 (1992). SUSCAS
11. P. Allongue, V. Kieling, and H. Gerischer, Electrochim. Acta 40, 1353 (1995)
12. P. Allongue, V. Kieling, and H. Gerischer, J. Electrochem. Soc. 140, 1019 (1993). JESOAN
13. P. Allongue, in Advances in Electrochemical Science and Engineering, H. Gerischer and C. W. Tobias (VCH Verlagesellschaft, Weinheim, 1995), Vol. 4, Chap. 1.
14. J. B. Price, in Semiconductor Silicon, H. R. Huff and R. R. Burgess, Electrochem. Soc. Soft Bounds (The Electrochemical Society, Princeton, NJ, 1973).
15. P. Allongue, V. Kieling, and H. Gerischer, J. Electrochem. Soc. 140, 1008 (1993)
16. P. Allongue, H. Brune, and H. Gerischer, Surf. Sci. 275, 414 (1992). SUSCAS
17. M. Elwenspoek, J. Electrochem. Soc. 140, 2075 (1993). JESOAN
18. P. Allongue and J. Kasparian, Microscopy, Microstruct. and Microanal. 5, 357 (1994). MMMIEY
19. P. Allongue (to be published).
20. M. Warntjes, C. Veillard, F. Ozanam, and J. N. Chazalviel, J. Electrochem. Soc. 142, 4138 (1995). JESOAN
21. R. J. Boyd and K. E. Edgecombe, J. Am. Chem. Soc. 110, 4182 (1988). JACSAT
22. J. A. Strocio, R. M. Feenstra, and A. P. Fein, Phys. Rev. Lett. 58, 1668 (1987). PRLTAO
23. R. S. Becker, G. H. Higashi, Y. J. Chabal, and A. J. Becker, Phys. Rev. Lett. 65, 1917 (1990).
24. PRLTAO