Correlation between surface morphology and spectral lineshape: a re-examination of the H-Si(111) stretch vibration

Surface Science

Volumn 430, Issue 1, 1999, Pages 67-79

  Newton, Theresa A ^a   Boiani, James A ^a   Hines, Melissa A ^a  

^a Department of Molecular Biology and Genetics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ETCHING; HYDROGEN; INFRARED SPECTROSCOPY; MOLECULES; MONTE CARLO METHODS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACES;

ANISOTROPIC ETCHING; ATOMIC SCALE ETCH PITS; INFRARED ABSORPTION SPECTROSCOPY; SPECTRAL LINESHAPE; STRETCH VIBRATION; SURFACE STEPS;

MOLECULAR VIBRATIONS;

EID: 0032654949     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00402-1     Document Type: Article

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