Silicon surface passivation by organic monolayers: Minority charge carrier lifetime measurements and Kelvin probe investigations

Journal of Physical Chemistry B

Volumn 107, Issue 28, 2003, Pages 6846-6852

  Sieval, Alexander B ^a,d   Huisman, Carolien L ^b   Schönecker, Axel ^c   Schuurmans, Frank M ^c   Van der Heide, Arvid S H ^c   Goossens, Albert ^b   Sinke, Wim C ^c   Zuilhof, Han ^a   Sudhölter, Ernst J R ^a  

^a WAGENINGEN UNIVERSITY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c TNO   (Netherlands)

^d Biomade Technology Foundation   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CHARGE CARRIERS; CHEMICAL BONDS; OXIDATION; PASSIVATION; SURFACE TREATMENT;

ORGANIC MONOLAYERS;

SEMICONDUCTING SILICON;

EID: 0041340738     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp034314v     Document Type: Article

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