Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 721-724

  Poortmans, J ^a   Vermeulen, T ^a   Nijs, J ^a   Mertens, R ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; FOURIER TRANSFORMS; INFRARED RADIATION; MICROWAVE MEASUREMENT; OXIDATION; PASSIVATION; SEMICONDUCTING SILICON;

MONOCRYSTALLINE SILICON; PHOTOCONDUCTANCE DECAY MEASUREMENT; SURFACE RECOMBINATION VELOCITIES;

PHOTOCONDUCTING MATERIALS;

EID: 0030384828     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pvsc.1996.564231     Document Type: Conference Paper

References (10)