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Volumn 93, Issue 12, 2003, Pages 10119-10124

Formation of interfacial layer during reactive sputtering of hafnium oxide

Author keywords

[No Author keywords available]

Indexed keywords

HAFNIUM COMPOUNDS; OXIDATION; PERMITTIVITY; PHYSICAL VAPOR DEPOSITION; SILICA; SPUTTERING;

EID: 0038819583     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1574594     Document Type: Article
Times cited : (59)

References (30)
  • 30
    • 0038454411 scopus 로고    scopus 로고
    • private communication
    • T. K. Kang (private communication).
    • Kang, T.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.