Bandtails and defects in microcrystalline silicon (μc-Si:H)

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 3, 2000, Pages 1792-1795

  Fuhs, W ^a   Kanschat, P ^a   Lips, K ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL DEFECTS; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; PHOTOCONDUCTIVITY; SEMICONDUCTING SILICON;

MEYER-NELDEL RELATIONSHIPS;

SEMICONDUCTING FILMS;

EID: 0034187462     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591473     Document Type: Article

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