Transport and recombination channels in undoped microcrystalline silicon studied by ESR and EDMR

Materials Research Society Symposium - Proceedings

Volumn 467, Issue , 1997, Pages 361-366

  Will, D ^a   Lerner, C ^a   Fuhs, W ^a   Lips, K ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ANNEALING; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRON SPIN RESONANCE SPECTROSCOPY; MODELS; SEMICONDUCTING SILICON; TRANSPORT PROPERTIES;

DEFECT DENSITY; ELECTRICALLY DETECTED MAGNETIC RESONANCE; HOPPING; MICROCRYSTALLINE SILICON; PERCOLATION PATH; RECOMBINATION CHANNEL;

SEMICONDUCTING FILMS;

EID: 0031361444     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-467-361     Document Type: Conference Paper

References (15)