Defect and tail states in microcrystalline silicon investigated by pulsed esr

Materials Research Society Symposium - Proceedings

Volumn 609, Issue , 2000, Pages A2731-A2736

  Kanschat, P ^a   Mell, H ^b   Lips, K ^a   Fuhs, W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; ENERGY GAP; PARAMAGNETIC RESONANCE; PARAMAGNETISM; SEMICONDUCTOR DOPING;

MICROCRYSTALLINE MATERIALS;

SEMICONDUCTING SILICON;

EID: 0034431129     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-609-a27.3     Document Type: Article

References (14)