Hot carrier transport effects in Al2O3-based metal-oxide-semiconductor structures

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 4, 2000, Pages 2153-2159

  Ludeke, R ^a   Cuberes, M T ^b   Cartier, E ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b UNIVERSITY OF CASTILLA LA MANCHA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23044522009     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

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