X-ray photoemission determination of the surface fermi level motion and pinning on n- and p-GaN during the formation of Au, Ni, and Ti metal contacts

Materials Research Society Symposium - Proceedings

Volumn 693, Issue , 2002, Pages 843-848

  Rickert, Kimberly A ^a   Kim, Jong Kyu ^a   Lee, Jong Lam ^a   Himpsel, Franz J ^a   Ellis, Arthur B ^a   Kuech, T F ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ENERGY GAP; FERMI LEVEL; GOLD; NICKEL; SCHOTTKY BARRIER DIODES; TITANIUM; X RAY SPECTROSCOPY;

BAND GAP; FERMI EDGE; FERMI LEVEL POSITION; SURFACE FERMI LEVEL MOTION; THIN METAL OVERLAYERS; X RAY PHOTOEMISSION SPECTROSCOPY;

GALLIUM NITRIDE;

EID: 0036374091     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (29)