Epitaxy of Al films on GaN studied by reflection high-energy electron diffraction and atomic force microscopy

Applied Physics Letters

Volumn 70, Issue 8, 1997, Pages 990-992

  Liu, Q Z ^a   Shen, L ^a   Smith, K V ^a   Tu, C W ^a   Yu, E T ^a   Lau, S S ^a   Perkins, N R ^b   Kuech, T F ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001593204     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118458     Document Type: Article

References (17)

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