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Volumn 15, Issue 7, 2000, Pages 756-760

Low resistance Al/Ti/n-GaN ohmic contacts with improved surface morphology and thermal stability

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; HIGH TEMPERATURE PROPERTIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; MULTILAYERS; NITRIDES; OHMIC CONTACTS; SEMICONDUCTING FILMS; THERMODYNAMIC STABILITY;

EID: 0034227948     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/15/7/316     Document Type: Article
Times cited : (69)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.