Lock-in technique for measuring friction on a nanometer scale

Applied Physics Letters

Volumn 68, Issue 20, 1996, Pages 2896-2898

  Colchero, J ^a   Luna, M ^a   Baro A M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000244616     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116324     Document Type: Article

References (10)

1. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. AIP 59, 1942 (1987).
2. G. Meyer and N. M. Amer, Appl. Phys. Lett. AIP 57, 2089 (1990).
3. O. Marti, J. Colchero, and J. Mlynek, Nanotechnology INS 1, 141 (1990).
4. J. Colchero, Reibungskraftmikroskopie (Hartung Gore Verlag Konstanz, Konstanz, Germany, 1993).
5. T. Göddenhenrich, S. Müller, and C. Heiden. Rev. Sci. Instrum. 65, 2870 (1994).
6. E. Meyer, R. Overney, D. Brodbeck, L. Howald, R. Lüthi, J. Frommer, and H.-J. Güntherrodt, Phys. Rev. Lett. AIP 69, 1777 (1992).
7. J. Hu, X. D. Xiao, D. F. Ogletree, and M. Salmeron, Surf. Sci. INS 327, 358 (1995).
8. The effect of the stick-slip corresponding to the atomic resolution of the friction loop is neglected, since it is not within the frequency range which is detected by the lock-in amplifier.
9. Topometrix, 1505 Wyatt Drive, Santa Clara, CA 95054.
10. J. Colchero, M. Luna, and A. M. Baró (unpublished).