Theoretical and experimental study of the forces between defferent SNOM probes and chemically treated AFM cantilevers

Proceedings of the IEEE

Volumn 88, Issue 9, 2000, Pages 1460-1470

  Bernal, Maria Pilar ^a   Marquis Weible, Fabienne ^a   Boillat, Pierre Yves ^a   Lambelet, Patrick ^a  

^a Institute of Applied Optics   (Switzerland)

Author keywords

Capillary forces; Coulotnbian forces; Friction; Hydmphilicily; Hydrophobicily; Scanning near field optical microscope; Shear force

Indexed keywords

EID: 2142665022     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.883317     Document Type: Article

References (16)

1. E. Betzig, P. L. Finn, aad J. S. Weiner, "Combined shear force and near-field scanning optical microscopy," Appl. Pkvs. Lett., vol. 60, no. 20, pp. 2484-2488, 1992.
2. R. Toledo-Crow, P. C. Yang. Y. Chen, and M. Vaez-Iravini, "Nearfield differential scanning optical microscopy with atomic force regulation," A/)/?J. Phy-s. Lett. vol. 60, no. 24, pp. 2957-2959, 1992.
3. F. Froehiich and T. Muster, "Mechanical resonance behavior of nearfield optical microscope probes," Appl. Phys. Lett., vol. 70, no. 12, pp. 1500-1502, 1997.
4. S. Davy, M. Spajcr, and D. Courjon, "Influence of the water layer on the shear force damping in near-field microscopy," Appl. Phys. Lett., vol. 73, no. 18, pp. 2594-2596, 1998.
5. M. J. Gregor, P. G. Blome, J. Schöfer, and R. G. Ulbrich, "Probesurface interaction in near-field optical microscopy: The nonlinear bending force mechanism," Appl. Phys. Lett., vol. 68, no. 3, pp. 307-309, 1996.
6. P. K. Kei and W. S. Fann, "The probe dynamics under shear force in near-field scanning optical microscopy," J. Appl. Phys., vol. 83, no. 7, pp. 3461-3468, 1998.
7. P. Lambelet, A. Sayah, M. Pfeffer, C. Philipona, and R Marquis-Weible, "Chemically etched fiber tips for near-field optical microscopy: A process for smoother tips," Appl. Opt., vol. 37. no. 31, pp. 7289-7292, 1998.
8. N. A. Bumham, R. J. Colton, and H. M. Pollock, "Work-function anisotropies as an origin of long-range surface forces," Phys. Rev. Lett., vol. 69, no. 1, pp. 144-147, 1992.
9. S. Gambier and C. Joachim, Scanning Probe Microscopy: Beyond the Images: Les Editions de Physique, 1992.
10. J. X. Israeiachvili, Intermolecular and Surface Forces. Norwell, MA: Kluwer, 1992.
11. L. D. Landau and E. M. Lifshitz, Fluid Mechanics. New York: Pergamon, 1987.
12. J. N. Israeiachvili, Fundamental of Friction: Macroscopic and Microscopic Processes. Norwell, MA: Kluwer, 1992.
13. H. Minshall, CRC Handbook of Chemistry and Physics. Boca Raton, FL: CRC Press. 1994.
14. M. Pfeffer, P. Lambelet, and F. Marquis-Weible, "Shear-force detection based on an external cavity laser interferometer for a compact scanning near field optical microscope," Rev. Sei. Inslrum., vol. 68, no. 12, pp. 4478-4482, 1997.
15. A. Ulman, An Introduction to U'trathin Organic Films from Lang-muir-Blodgett to Self Assembly. New York: Academic, 1997.
16. R. Branner, O. Marti, and O. Hollricher, "Influence of environmental conditions on shear-force distance control in near-field optical microscopy," J. Appl. Phys., vol. 86, no. 12, pp. 7100-7106, 1999.