Velocity dependence and limitations of friction force microscopy of mica and graphite

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 6 B, 2000, Pages 3804-3807

  Hoshi, Yasuo ^a   Kawagishi, Takayoshi ^a   Kawakatsu, Hideki ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

Atomic; Contact; Crystal; Force; Friction; Graphite; Mica; Microscope; Scanning; Velocity

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; FRICTION; GRAPHITE; HYDROPHOBICITY; MICA; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; PYROLYSIS;

FRICTION FORCE MICROSCOPY; HYDROPHILICITY;

CRYSTALS;

EID: 0034206109     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3804     Document Type: Article

References (19)

1. G. Binnig, C. F. Quate and Ch. Gerber: Phys. Rev. Lett. 56 (1986) 930.
2. C. M. Mate, G. M. McClelland, R. Erlandsson and S. Chiang: Phys. Rev. Lett. 59 (1987) 1942.
3. R. Erlandsson, G. Hadziioannou, C. M. Mate, G. M. McClelland and S. Chiang: J. Chem. Phys. 89 (1988) 5190.
4. J.-A. Ruan and B. Bhushan: J. Appl. Phys. 76 (1994) 5022.
5. S. Fujisawa, E. Kishi, Y. Sugawara and S. Morita: Forces in Scanning Probe Methods, eds. H.-J. Güntherodt et al. (Kluwer Academic Publishers, Dordrecht, 1995) p. 313.
6. D. F. Ogletree, J. Hu, X.-D. Xiao, C. Morant, Q. Dai, R. Vollmer, R. Carpick and M. Salmeron: Forces in Scanning Probe Methods, eds. H.-J. Güntherodt et al. (Kluwer Academic Publishers, Dordrect, 1995) p. 337.
7. S. Morita, S. Fujisawa, E. Kishi, M. Ohta, H. Ueyama and Y. Sugawara: Thin Solid Films 273 (1996) 138.
8. S. Fujisawa, Y. Sugawara and S. Morita: Jpn. J. Appl. Phys. 35 (1996) 5909.
9. N. Sasaki, M. Tsukada and K. Kobayashi: Micro/Nanotribology and Its Applications, ed. B. Bhushan (Kluwer Academic Publishers, Dordrect, 1997) p. 355.
10. N. Sasaki, M. Tsukada, S. Fujisawa, Y. Sugawara, S. Morita and K. Kobayashi: Phys. Rev. B 57 (1998) 3785.
11. R. M. Overney, H. Takano, M. Fujihira, E. Meyer and H.-J. Güntherodt: Thin Solid Films 240 (1994) 105.
12. M. R. Sørensen, K. W. Jacobsen and P. Stoltze: Phys. Rev. B 53 (1996) 2101.
13. V. N. Koinkar and B. Bhushan: J. Vac. Sci. & Technol. A 14 (1996) 2378.
14. O. Teschke and E. F. Souza: Rev. Sci. Instrum. 69 (1998) 3588.
15. B. N. J. Persson: Micro/Nanotribology and Its Applications, ed. B. Bhushan (Kluwer Academic Publishers, Dordrect, 1997) p. 555.
16. R. Bennewitz, T. Gyalog, M. Guggisberg, M. Bammerlin, E. Meyer and H.-J. Güntherodt: Phys. Rev. B 60 (1999) R11 301.
17. H. Kawakatsu and T. Saito: J. Vac. Sci. & Technol. B 14 (1994) 872.
18. Olympus Optical Co., Ltd.: Micro Cantilever for Contact Mode LFM, OMCS-RC800PSA.
19. S. Miyake: Appl. Phys. Lett. 65 (1994) 980.