Dynamic friction force measurement with the scanning force microscope

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 341-347

  Krotil, H U ^a   Weilandt, E ^a   Stifter, Th ^a   Marti, O ^a   Hild, S ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; FRICTION; IMPURITIES; LATTICE VIBRATIONS; POLYMER BLENDS; POLYOLEFINS; SILICON; TRIBOLOGY; VISCOELASTICITY;

DYNAMIC SCANNING FRICTION FORCE MICROSCOPY; LATERAL VIBRATION; LOCK-IN TECHNIQUES; SCANNING FORCE MICROSCOPY; SCANNING FRICTION FORCE MICROSCOPY; TIP SAMPLE INTERACTION;

SURFACE ROUGHNESS;

EID: 0032669424     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<341::AID-SIA513>3.0.CO;2-B     Document Type: Article

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