Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes

Applied Physics Letters

Volumn 74, Issue 22, 1999, Pages 3296-3298

  Stark, Robert W ^a   Drobek, Tanja ^a   Heckl, Wolfgang M ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001173529     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123323     Document Type: Article

References (23)

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16. 0=40 kHz, L=200 μm, W=40 μm, T=2.0 μm (NT-MDT, Russia).
17. Topometrix Explorer, 130 μm dry scanner (Topometrix GmbH, Darmstadt, Germany).
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