Using embedded FPGAs for SoC yield improvement

Proceedings - Design Automation Conference

Volumn , Issue , 2002, Pages 713-724

  Abramovici, Miron ^a   Stroud, Charles ^b   Emmert, Marty ^c  

^a AGERE SYSTEMS   (United States)

^b UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

^c WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENTS (ATE); SYSTEM-ON-CHIP (SOC) DESIGNS;

ALGORITHMS; AUTOMATIC TESTING; CODE DIVISION MULTIPLE ACCESS; DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS; FIELD PROGRAMMABLE GATE ARRAYS; SEMICONDUCTOR DEVICE MANUFACTURE;

SEMICONDUCTOR DEVICE TESTING;

EID: 0036045482     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2002.1012717     Document Type: Article

References (31)

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