Pseudo random patterns using Markov sources for scan BIST

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1013-1021

  Basturkmen, Nadir Z ^a   Reddy, Sudhakar M ^a   Pomeranz, Irith ^b  

^a UNIVERSITY OF IOWA   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CORRELATION METHODS; ITERATIVE METHODS; MARKOV PROCESSES; SCANNING; SET THEORY;

BENCHMARK CIRCUITS; PSEUDO RANDOM PATTERN GENERATOR; SCAN BUILT-IN SELF TEST;

BUILT-IN SELF TEST;

EID: 0036446465     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)

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