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Volumn 2000-January, Issue , 2000, Pages 472-475

Diagnosis of interconnect faults in cluster-based FPGA architectures

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER COMPUTING; COMPUTER AIDED DESIGN; APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; FAILURE ANALYSIS; MATRIX ALGEBRA;

EID: 0034478157     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2000.896517     Document Type: Conference Paper
Times cited : (25)

References (13)
  • 1
    • 84949776389 scopus 로고    scopus 로고
    • Virtex data sheet
    • Virtex data sheet. Xilinx Corporation, 2000.
    • (2000) Xilinx Corporation
  • 2
    • 0022089113 scopus 로고
    • A practical approach to fault simulation and test generation for bridging faults
    • July
    • M. Abramovici and P. R. Menon. A practical approach to fault simulation and test generation for bridging faults. IEEE Transactions on Computers, C-34 (7);658-663, July 1985.
    • (1985) IEEE Transactions on Computers , vol.C-34 , Issue.7 , pp. 658-663
    • Abramovici, M.1    Menon, P.R.2
  • 7
    • 0033683769 scopus 로고    scopus 로고
    • Interconnect testing in cluster-based FPGA architectures
    • June
    • I. G. Harris and R. Tessier. Interconnect testing in cluster-based FPGA architectures. In Design Automation Conference, June 2000.
    • (2000) Design Automation Conference
    • Harris, I.G.1    Tessier, R.2
  • 12
    • 0015564343 scopus 로고
    • Enhancing testability of large-scale integrated circuits via test points and additional logic
    • January
    • M. J. Y. Williams and J. B. Angel. Enhancing testability of large-scale integrated circuits via test points and additional logic. IEEE Transactions on Computers, C-22(1):46-60, January 1973.
    • (1973) IEEE Transactions on Computers , vol.C-22 , Issue.1 , pp. 46-60
    • Williams, M.J.Y.1    Angel, J.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.