On-line BIST and diagnosis of FPGA interconnect using roving stars

Proceedings - 7th International On-Line Testing Workshop, IOLTW 2001

Volumn 2001-January, Issue , 2001, Pages 27-33

  Stroud, Charles ^a   Lashinsky, Matthew ^a   Nall, Jeremy ^a   Emmert, John ^a   Abramovici, Miron ^b  

^a University of North Carolina at Charlotte   (United States)

^b AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANT COMPUTER SYSTEMS; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); STARS;

DIAGNOSTIC APPROACH; FAULT-TOLERANT APPLICATIONS; HIGH RESOLUTION; INTERCONNECT BIST; ON-LINE BIST; PROGRAMMABLE INTERCONNECT;

BUILT-IN SELF TEST;

EID: 85013621311     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2001.937813     Document Type: Conference Paper

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