On n-detection test sets and variable n-detection test sets for transition faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 3, 2000, Pages 372-383

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; MATHEMATICAL MODELS; PARAMETER ESTIMATION; TIMING CIRCUITS;

DELAY DEFECTS; DETECTION TEST SETS; TRANSITION FAULTS;

COMBINATORIAL CIRCUITS;

EID: 0034156860     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.833205     Document Type: Article

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