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Volumn , Issue , 1983, Pages 258-265
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ON TESTING STUCK-OPEN FAULTS.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS LOGIC GATES;
COMBINATIONAL CIRCUITS;
INTERNAL FAN-OUT-FREE CIRCUITS;
PATH SENSITIZING;
RECONVERGENT FAN-OUT CIRCUITS;
STUCK-OPEN FAULTS;
INTEGRATED CIRCUITS, VLSI;
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EID: 0020590237
PISSN: 07313071
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (52)
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References (0)
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