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Volumn , Issue , 1992, Pages 722-728
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At-speed test is not necessarily an AC test
a
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TESTING;
COMPUTER HARDWARE;
COMPUTER PROGRAMMING;
LOGIC CIRCUITS;
AC TEST;
LEVEL SENSITIVE SCAN DESIGN;
ELECTRON DEVICE TESTING;
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EID: 0026678340
PISSN: 07431686
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (23)
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References (6)
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