SOPRANO: An efficient automatic test pattern generator for stuck-open faults in CMOS combinational circuits

27th ACM/IEEE Design Automation Conference. Proceedings 1990

Volumn , Issue , 1990, Pages 660-666

  Lee, Hyung Ki ^a   Ha, Dong Sam ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS, COMBINATORIAL - AUTOMATIC TESTING; LOGIC DEVICES - GATES;

AUTOMATIC TEST PATTERN GENERATORS; SOFTWARE PACKAGE SOPRANO; STUCK-OPEN FAULTS;

INTEGRATED CIRCUITS, CMOS;

EID: 0025550198     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)