COMPARISON OF ac SELF-TESTING PROCEDURES.

Digest of Papers - International Test Conference

Volumn , Issue , 1983, Pages 89-94

  Barzilai, Z ^a   Rosen, B K ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AC FAULTS; COMPUTER PROGRAM MONITOR; LEVEL SENSITIVE SCAN DESIGN; SELF-TESTING PROCEDURES;

ELECTRONIC EQUIPMENT TESTING;

EID: 0020933517     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)