Non-robust versus robust

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 123-131

  Pierzynska, Alicja ^a   Pilarski, Slawomir ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; DELAY CIRCUITS; ELECTRIC PROPERTIES; ERROR DETECTION; FAILURE ANALYSIS; LOGIC CIRCUITS; LOGIC DESIGN; MATHEMATICAL MODELS;

DELAY FAULT DETECTION; ELECTRICAL PHENOMENA; LOGIC STRUCTURE; NON-ROBUST TEST; PATH DELAY; ROBUST TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0029517972     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)