On the decline of testing efficiency as fault coverage approaches 100%

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1995, Pages 74-83

  Wang, Li C ^a   Mercer, M Ray ^a   Kao, Sophia W ^a   Williams, Thomas W ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT COVERAGE; TESTING EFFICIENCY;

DEFECTS; EFFICIENCY; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; PROBABILITY; QUALITY ASSURANCE; STANDARDS;

INTEGRATED CIRCUIT TESTING;

EID: 0029215035     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)