REDO - random excitation and deterministic observation - first commercial experiment

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 268-274

  Grimaila, Michael R ^a   Lee, Sooryong ^a   Dworak, Jennifer ^a   Butler, Kenneth M ^a   Stewart, Bret ^a   Balachandran, Hari ^a   Houchins, Bryan ^a   Mathur, Vineet ^a   Park, Jaehong ^a   Wang, Li C ^a   Mercer, M Ray ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUIT MANUFACTURE; LOGIC GATES; MICROPROCESSOR CHIPS; OPTIMIZATION; PROBABILITY;

RANDOM EXCITATION AND DETERMINISTIC OBSERVATION; TEST PATTERN GENERATION TECHNIQUES;

INTEGRATED CIRCUIT TESTING;

EID: 0032638329     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)